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"CMM" does not refer to a coordinate measuring machine. Instead, it refers to Camtek Map Manager, which is a software module used to manage the mapping of semiconductor wafers.
Camtek Map Manager is a part of Camtek's software suite for semiconductor inspection and metrology. It is used to import, manage, and analyze wafer maps, which are graphical representations of the physical layout of semiconductor devices on a wafer. With Camtek Map Manager, users can view and analyze wafer maps, perform statistical analysis, and generate reports.
The "CMM set" in Camtek's software documentation may refer to a specific set of options or settings related to wafer mapping and analysis. These settings might include things like the data format for importing wafer maps, the type of analysis to perform, and the parameters for generating reports.
By selecting the appropriate CMM set in Camtek Map Manager, users can ensure that they are using the software to its fullest potential and getting the most accurate and useful information from their wafer maps. |
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