Multisensor Systems Ramp Up
Faster processors, improved accuracy spur multisensor adoption
By Patrick Waurzyniak, Senior Editor
Photo courtesy of Nikon Instruments Inc.
Multisensor metrology systems have existed for years, but the technology has become more popular recently as manufacturers seek more versatile measurement tools in the latest systems combining vision, laser, and touch-probe scanning technology.
As precision parts require ever-tighter tolerances and increase demands on quality, some benchtop metrology systems formerly dedicated to video inspection can now handle touch probes and lasers to provide multisensor measurement in a compact package. In some cases, features that were formerly found only on larger multisensor metrology equipment are now migrating to smaller benchtop-style multisensor measurement systems, partly due to the increased computer power available with advanced microprocessors.
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